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1
Single Event Upset Study of 22 nm Fully Depleted Silicon-on-Insulator Static Random Access Memory with Charge Sharing Effect
Published 2023-08-01Subjects: Get full text
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2
Design of Robust Latch for Multiple-Node Upset (MNU) Mitigation in Nanoscale CMOS Technology
Published 2020-01-01Subjects: Get full text
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3
CdTe Based Energy Resolving, X-ray Photon Counting Detector Performance Assessment: The Effects of Charge Sharing Correction Algorithm Choice
Published 2020-10-01Subjects: Get full text
Article