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    Power Performance Analysis of Digital Standard Cells for 28 nm Bulk CMOS at Cryogenic Temperature Using BSIM Models

    Power Performance Analysis of Digital Standard Cells for 28 nm Bulk CMOS at Cryogenic Temperature Using BSIM Models by Rakshith Saligram, Wriddhi Chakraborty, Ningyuan Cao, Yu Cao, Suman Datta, Arijit Raychowdhury

    Published 2021-01-01
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