Characterization of a direct detection device imaging camera for transmission electron microscopy by Milazzo, A, Moldovan, G, Lanman, J, Jin, L, Bouwer, J, Klienfelder, S, Peltier, S, Ellisman, M, Kirkland, A, Xuong, N

Measuring composition and strain in bimetallic catalyst nanoparticles using advanced electron microscopy by Luo, X

Subjects: “…Scanning transmission electron microscopy…”

Characterization of a direct detection device imaging camera for transmission electron microscopy. by Milazzo, A, Moldovan, G, Lanman, J, Jin, L, Bouwer, J, Klienfelder, S, Peltier, S, Ellisman, M, Kirkland, A, Xuong, N

“…The complete characterization of a novel direct detection device (DDD) camera for transmission electron microscopy is reported, for the first time at primary electron energies of 120 and 200 keV. …”

Characterization of a direct detection device imaging camera for transmission electron microscopy by Milazzo, A, Moldovan, G, Lanman, J, Jin, L, Bouwer, J, Klienfelder, S, Peltier, S, Ellisman, M, Kirkland, A, Xuong, N

“…The complete characterization of a novel direct detection device (DDD) camera for transmission electron microscopy is reported, for the first time at primary electron energies of 120 and 200 keV. …”

Thickness dependence of scattering cross-sections in quantitative scanning transmission electron microscopy by Martinez, G, Van Den Bos, K, Alania, M, Nellist, P, Van Aert, S

“…In quantitative scanning transmission electron microscopy (STEM), scattering cross-sections have been shown to be very sensitive to the number of atoms in a column and its composition. …”

Scanning Electron Microscopy (SEM) studies of passiflora species available in Peninsular Malaysia by Veeramohan, R., Haron, N.W.

“…Micromorphological characteristics of four Passiflora species were distinguished by Scanning Electron Microscopy (SEM) studies. Stomata, trichomes, and epidermal surfaces’ structure of leaves of each species were observed using a scanning electron microscope.…”
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Structural investigations on nanocrystalline Ni-W alloy films by transmission electron microscopy by Klimenkov, Michael, Haseeb, A.S. Md. Abdul, Bade, Klaus

“…Electrode posited Ni-W alloys have been investigated in the as-deposited state by transmission electron microscopy in order to investigate the microstructural features in dependence of the tungsten content. …”

Evaluation of cells integrity using different fixation time by scanning electron microscopy by Mad Yasin, Ida Muryany, Rajab, Nor Fadilah, Md Yasin, Ina Salwany, Ghazali, Ahmad Rohi, Saad, Mohd Zamri, Md Ambia, Kaswandi, Sahalan, Ahmad Zorin, Hing, Hiang Lian

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Scanning electron microscopy (SEM) and energy-dispersive x-ray (EDX) spectroscopy by Abd Mutalib, M., Rahman, M. A., Othman, M. H. D., Ismail, A. F., Jaafar, J.

“…Therefore, in this chapter, three important morphological characterization techniques, which are scanning electron microscopy (SEM), field emission scanning electron microscopy (FESEM), and energy dispersive X-ray (EDX) spectroscopy will be discussed in detail. …”

Crystal morphology of antimony treated Al-Si eutectic alloys / by 183648 Ali Ourdjini, Scientific Conference [of] Electron Microscopy Society Malaysia (5th : 1995 : Selangor)

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Characterisation and Evaluation of Antimicrobial, Antioxidant and Antibiofilm Activities of Silver Nanoparticles Biosynthesised from Harpullia arborea Bark Extract by Ramasamy Rajeswari, Shunmugasundaram Murugesh, Dhanasekaran Jegadeesh Kumar, B Prakash, Kasirajan Gayathri

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Structural Factors Inducing Cracking of Brass Fittings by Lenka Kunčická, Michal Jambor, Adam Weiser, Jiří Dvořák

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Bridging the resolution gap: correlative super-resolution imaging by Dobbie, IM

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Problem solving with microbeam analysis / by 458668 Kiss, Klara

Subjects: “…Electron microscopy…”

Electron microscopic studies of the mechanism of action of the restriction endonuclease of Escherichia coli B / by 295402 Rosamond, John, Endlich, Brian, Linn, Stuart

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ULSI semiconductor technology atlas / by Tung, Chih-Hang, 1963-, Sheng, George T. T., Lu, Chih-Yuan, 1950-

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Proceedings for 7th Asia Pacific Electron Microscopy Conference, 26-30 June 2000, Singapore International Convention & Exibition Centre, Suntec City, Singapore : perspective imaging by Asia Pacific Electron Microscopy Conference (7th : 2000 : Singapore)

Subjects: “…Electron microscopy…”

Advanced electron microscopy and nanomaterials : selected, peer reviewed papers from the First Joint Advanced Electron Microscopy School for Nanomaterials and the Workshop on Nanomaterials (AEM-NANOMAT '09), Saltillo (Coahuila) Mx̌ico, September 29th-October 2nd, 2009 / by Advanced Electron Microscopy School for Nanomaterials (1st : 2009 : Saltillo (Coahuila) Mx̌ico), Ponce, Arturo, Bueno, Daro̕, Workshop on Nanomaterials (1st : 2009 : Saltillo (Coahuila) Mx̌ico)

Subjects: “…Electron microscopy…”

Kajian morfologi adunan ko-polimer polipropilena (PP) menggunakan scanning electron microscopy (SEM) / by 246050 Ahmad Haizullizuan Ibrahim

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Electron micrographs of clay minerals/ by Sudo, Toshio

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