Low-frequency flute instabilities in intense nonneutral electron and ion beams by Uhm, H.S., Davidson, R.C.

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Chaotic behavior and halo development in the transverse dynamics of heavy ion beams by Chen, C., Qian, Q., Davidson, R.

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Perovskite-ion beam interactions : toward controllable light emission and lasing by Wang, Yue, Gu, Zhiyuan, Ren, Yinjuan, Wang, Ziming, Yao, Bingqing, Dong, Zhili, Adamo, Giorgio, Zeng, Haibo, Sun, Handong

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Ion gun development/Ion beam etching and deposition system development by Ahn, Jaeshin

“…Development of ion gun and ion beam etching and deposition system.…”
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Ion-beam studies and isotope production using dense plasma focus by S. V. Springham

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Fabrication of 3D microstructures using focused ion beam milling by Loo, Yee Wei.

“…This research project looked into the possibility of developing the real 3D cavities using focused ion beam (FIB) milling.…”
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Design evaluation of microelectronics devices using focused ion beam technology by Yeo, Swee Hock.

“…To be able to achieve the above, critical tools (e.g. focus-ion beam) and the relevant expertise and competencies have to be developed. …”
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Monitoring carbon in electron and ion beam deposition within FIB-SEM by Farr, NTH, Hughes, GM, Rodenburg, C

“…It is well known that carbon present in scanning electron microscopes (SEM), Focused ion beam (FIB) systems and FIB-SEMs, causes imaging artefacts and influences the quality of TEM lamellae or structures fabricated in FIB-SEMs. …”

Focused ion beam assisted nanofabrication - Patterned growth of carbon nanotubes by Jiao, J, Dong, L, Foxley, S, Mosher, C, Tuggle, D

Field-ion specimen preparation using focused ion-beam milling by Larson, D, Foord, D, Petford-Long, A, Liew, H, Blamire, MG, Cerezo, A, Smith, G

“…Preparation of field-ion specimens from various materials has been accomplished using focused ion-beam milling in either a simple cutting mode or by application of an annular-shaped ion-milling pattern. …”

Focused ion beam milling of exfoliated graphene for prototyping of electronic devices by Schmidt, Marek E., Johari, Zaharah, Ismail, Razali, Mizuta, Hiroshi, Chong, Harold M. H.

“…We demonstrate a focused ion beam (FIB) prototyping technique that accurately aligns a two terminal contact structure to exfoliated graphene. …”

Fabrication of si micropore and graphene nanohole structures by focused ion beam by Md. Ibrahim, Nik Noor Nabilah, Hashim, Abdul Manaf

“…This paper reports a novel technique of using a focused ion beam (FIB) as a tool for direct fabrication of both conical-shaped micropore in Si3N4/Si and a nanohole in graphene to act as a fluidic channel and sensing membrane, respectively. …”

Changes in structural-phase state and physicochemical properties of tungsten-free TIC-TiNi hard alloys after various types of ion-beam treatment by V. V. Akimov, A. M. Badamshin, S. N. Nesov, S. N. Povoroznyuk, A. A. Krutko, Ya. A. Sidorova

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Broad ion beam milling of focused ion beam prepared transmission electron microscopy cross-section specimens for high resolution electron microscopy using silicon support membranes by Langford, R, Ozkaya, D, Huey, B, Petford-Long, A

“…The use of focused ion beam systems is becoming routine for the preparation of site specific TEM cross-section specimens which are typically 50-100 nm. thick. …”

Multi-beamlet focusing of intense negative ion beams by aperture displacement technique / by Takeiri, Y.

An experimental investigation of high energy ion beam production in the plasma focus / [mikrofilem] by 416920 Powell, Charles William

Consideration of fluctuation in secondary beam intensity of heavy ion beam prove measurements / by A. Fujisawa

Source-to-target simulation of simultaneous longitudinal and transverse focusing of heavy ion beams by D. R. Welch, J. E. Coleman, P. A. Seidl, P. K. Roy, E. Henestroza, E. P. Lee, A. B. Sefkow, E. P. Gilson, T. C. Genoni, D. V. Rose

“…Longitudinal bunching factors in excess of 70 of a 300-keV, 27-mA K^{+} ion beam have been demonstrated in the neutralized drift compression experiment [P. …”
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Oblique propagation and temperature effects on the resonant right-hand ion beam instability by Ari Le, Li-Jen Chen, Blake Wetherton, Brett Keenan, Adam Stanier

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Ion beam profiling from the interaction with a freestanding 2D layer by Ivan Shorubalko, Kyoungjun Choi, Michael Stiefel, Hyung Gyu Park

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