Development of Parallel Plate Avalanche Counter for heavy ion collision in radioactive ion beam by Xianglun Wei, Fenhai Guan, Herun Yang, Yijie Wang, Junwei Zhang, Peng Ma, Xinyue Diao, Chengui Lu, Meng Li, Yuanfan Guan, Limin Duan, Rongjiang Hu, Xiuling Zhang, Zhigang Xiao

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Spectral and spatial shaping of a laser-produced ion beam for radiation-biology experiments by L. Pommarel, B. Vauzour, F. Mégnin-Chanet, E. Bayart, O. Delmas, F. Goudjil, C. Nauraye, V. Letellier, F. Pouzoulet, F. Schillaci, F. Romano, V. Scuderi, G. A. P. Cirrone, E. Deutsch, A. Flacco, V. Malka

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A simple and compact method for measuring the hydrogen ion fraction of hybrid ion beams by Ke Jianlin, Zhou Changgeng, Qiu Rui, Hu Yonghong, Liu Bin, He Tie, An Li

“…A simple and compact method for measuring the hydrogen fraction of hybrid ion beams is introduced in this paper. The method is based on the difference of stopping powers for protons and other heavier ions. …”
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A New High-Throughput Focused MeV Ion-Beam Analysis Setup by Sören Möller, Daniel Höschen, Sina Kurth, Gerwin Esser, Albert Hiller, Christian Scholtysik, Christian Dellen, Christian Linsmeier

Subjects: “…ion-beam analysis…”
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Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing by Piotr Kunicki, Tihomir Angelov, Tzvetan Ivanov, Teodor Gotszalk, Ivo Rangelow

“…The mechanical structure of the cantilevers integrating Wheatstone piezoresistive was modified with the use of focused ion beam (FIB) technology in order to increase the deflection sensitivity with minimal influence on structure stiffness and its resonance frequency. …”
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Quantitative Lithiation Depth Profiling in Silicon Containing Anodes Investigated by Ion Beam Analysis by Sören Möller, Hyunsang Joo, Marcin Rasinski, Markus Mann, Egbert Figgemeier, Martin Finsterbusch

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Polarimetry for ³He Ion Beams from Laser–Plasma Interactions by Chuan Zheng, Pavel Fedorets, Ralf Engels, Chrysovalantis Kannis, Ilhan Engin, Sören Möller, Robert Swaczyna, Herbert Feilbach, Harald Glückler, Manfred Lennartz, Heinz Pfeifer, Johannes Pfennings, Claus M. Schneider, Norbert Schnitzler, Helmut Soltner, Markus Büscher

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Reducing adhesion energy of micro-relay electrodes by ion beam synthesized oxide nanolayers by Bivas Saha, Alexis Peschot, Benjamin Osoba, Changhyun Ko, Leonard Rubin, Tsu-JaeKing Liu, Junqiao Wu

“…We employ a low-energy ion-beam synthesis technique and subsequent thermal annealing to form very thin layers (∼2 nm) of metal-oxides (such as RuO2 and WOx) on Ru and W metal surfaces and quantify the adhesion energy using an atomic force microscope with microspherical tips.…”
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Sample spinning to mitigate polarization artifact and interstitial-vacancy imbalance in ion-beam irradiation by Ren, Cui-Lan, Yang, Yang, Li, Yong-Gang, Huai, Ping, Zhu, Zhi-Yuan, Li, Ju

“…© 2020, The Author(s). Accelerator-based ion-beam irradiation has been widely used to mimic the effects of neutron radiation damage in nuclear reactors. …”
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Source Shot Noise Mitigation in Focused Ion Beam Microscopy by Time-Resolved Measurement by Peng, Minxu, Murray-Bruce, John, Berggren, Karl K, Goyal, Vivek K

“…© 2020 Elsevier B.V. Focused ion beam microscopy suffers from source shot noise – random variation in the number of incident ions in any fixed dwell time – along with random variation in the number of detected secondary electrons per incident ion. …”
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On the growth of semiconductor-based epitaxial and oxide films from low energy ion beams by Vancauwenberghe, Olivier P. J.

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Focused ion beam nanomachining for analyzing effects of light-structure interaction on hair color by Wang, Houxiao, Zhou, Wei

“…The light-structure interaction was considered for hair color deciphering. Using focused ion beam (FIB) nanomachining and scanning electron microscopy (SEM) imaging, the hair shaft structures were observed, and the effects of light-structure interaction on hair coloration/whitening were analyzed. …”
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Surface plasmon enhanced photoluminescence of monolayer WS₂ on ion beam modified functional substrate by Chu, Lingrui, Li, Ziqi, Zhu, Han, Li, Rang, Ren, Feng, Chen, Feng

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Atomic-level insight into process and mechanism of ion beam machining on aluminum optical surface by Du, Chunyang, Dai, Yifan, Hu, Hao, Guan, Chaoliang, Liu, Junfeng, Lai, Tao, Tian, Yuanyuan

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Plasmonic properties of two-dimensional metallic nanoholes fabricated by focused ion beam lithography by Zhu, Shaoli, Zhou, Wei

“…We used the finite-difference time-domain method to design the transmission and the localized surface plasmon resonance electric field distribution in the near field. The focused ion beam method was used to fabricate the nanoholes. …”
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Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis by Korsunsky, A, Salvati, E, Lunt, A, Sui, T, Mughal, M, Daniel, R, Keckes, J, Bemporad, E, Sebastiani, M

“…Residual stress analysis by micro-ring core Focused Ion Beam milling directly at sample surface offers lateral resolution better than 1 μm, and encodes information about residual stress depth variation. …”

Generalised residual stress depth profiling at the nanoscale using focused ion beam milling by Salvati, E, Romano-Brandt, L, Mughal, M, Sebastiani, M, Korsunsky, A

“…The recent advent of Focused Ion Beam methods opened up methods suitable for direct application at sample surface, yet allowing the observation and quantification of stress relief phenomena at the nano-scale. …”

Self-organized amorphous material in silicon(001) by focused ion beam (FIB) system by Huang, Y, Cockayne, D, Marsh, C, Titchmarsh, J, Petford-Long, A

“…A method using a focused ion beam (FIB) to prepare a silicon amorphous material is presented. …”

Software architecture for capturing clinical information in hadron therapy and the design of an ion beam for radiobiology by Abler, D

“…The results of these studies indicate future research directions towards a new ion beam facility for biomedical research.</p>…”

Carbon ion-beam-induced modification in structural and electrical properties of ZnO nanowires by Iqbal, Javed, Tabassum, H., Ahmad, Ishaq, Jan, Tariq, C.F., Dee, Madhuku, M., Umar, A.A., Ahmad, N.

“…In the present work, structural and electrical properties of ZnO NWs have been modified by carbon (C) ions- beam irradiation. With ion-beam energy of 0.8MeV, the physical behaviors of NWs have been studied under different doses from 1×1012 to 1×1014 ions/cm2. …”
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