Showing 361 - 380 results of 4,252 for search '"ion beam"', query time: 0.96s Refine Results
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    Nanometer size hole fabrication in 2d ultrathin films with cluster ion beams by Z. Insepov, A. Ainabayev, S. Kirkpatrick, M. Walsh Jr., A. F. Vyatkin

    Published 2017-07-01
    “…Gas cluster ion beams are proposed as a new tool for producing nanometer sized holes in ultrathin 2D films. …”
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    Nonstoichiometry in TiO2−y Studied by Ion Beam Methods and Photoelectron Spectroscopy by K. Zakrzewska

    Published 2012-01-01
    “…This paper treats a problem of nonstoichiometry in TiO2−y thin films deposited by reactive sputtering at controlled sputtering rates. Ion beam techniques, Rutherford backscattering (RBS), and nuclear reaction analysis (NRA) along with X-ray photoelectron spectroscopy have been applied to determine a deviation from stoichiometry y in the bulk and at the surface of TiO2−y layers. …”
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    First observation of ion beam channeling in bent crystals at multi-TeV energies by S. Redaelli, M. Butcher, C. Barreto, R. Losito, A. Masi, D. Mirarchi, S. Montesano, R. Rossi, W. Scandale, P. Serrano Galvez, G. Valentino, F. Galluccio

    Published 2021-02-01
    “…Using this experimental setup, tests with fully-stripped lead ion beams at both 450 Z and 6500 Z GeV were carried during dedicated LHC beam time. …”
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    A simple and compact method for measuring the hydrogen ion fraction of hybrid ion beams by Ke Jianlin, Zhou Changgeng, Qiu Rui, Hu Yonghong, Liu Bin, He Tie, An Li

    Published 2016-12-01
    “…A simple and compact method for measuring the hydrogen fraction of hybrid ion beams is introduced in this paper. The method is based on the difference of stopping powers for protons and other heavier ions. …”
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    Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing by Piotr Kunicki, Tihomir Angelov, Tzvetan Ivanov, Teodor Gotszalk, Ivo Rangelow

    Published 2019-10-01
    “…The mechanical structure of the cantilevers integrating Wheatstone piezoresistive was modified with the use of focused ion beam (FIB) technology in order to increase the deflection sensitivity with minimal influence on structure stiffness and its resonance frequency. …”
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