Features of construction of a measuring rotation devices cell for measurement viscosity by А. А. Smirnykh

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Simulation of electromagnetic field distribution in the measuring cell for determining the dielectric permittivity of materials at microwave frequencies by N. A. Pevneva, A. A. Kopshai, A. L. Gurskii

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Using the cylindrical rod method and a vector network analyzer to determine the dielectric permittivity of materials on microwave range by N. A. Pevneva, A. L. Gurskii, A. M. Kostrikin

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Free space method using a vector network analyzer to determine the dielectric permittivity of materials in microwave range by N. A. Pevneva, A. L. Gurskii, A. M. Kostrikin

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Modeling and Experimental Approbation of a Hardware and Software Complex for Determining the Impedance Parameters of an Amniotic Fluid by K. E. Meshkova, M. V. Davydov, S. V. Patseev, A. R. Saveyko, V. V. Pashkilevich

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Estimation of S-parameters and dielectric permittivity of quartz ceramics samples in millimeter waveband by N. A. Pevneva, D. A. Kondrashov, A. L. Gurskii, A. V. Gusinsky

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Estimation of S-Parameters and Dielectric Permittivity of Polycor and GaAs Samples Using a Vector Network Analyzer by D. A. Kondrashov, N. A. Pevneva, A. V. Gusinsky, A. A. Pavlyuchik, M. A. Goncharik

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Method for Monitoring the Stator Core of a Powerful Turbo Generator by A. S. Levitskyi, Ie. O Zaitsev, M. V. Panchik

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Optimized measurement methods and systems for the dielectric properties of active biological tissues in the 10Hz-100 MHz frequency range by Yueying Shi, Xiaoxiao Bai, Jingrong Yang, Xinyu Wu, Lei Wang

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ELECTRICAL POTENTIAL BETWEEN NON-PARALLEL FLAT ELECTRODES –SIMULATION OF A CELL USED WITH TOMATO by A. Hemsy

Subjects: “…measuring cells…”
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On the Measurement of Electric Resistance of Liquid Electrolytes of Accumulator Battery by N. N. Grinchik, K. V. Dobrego, M. A. Chumachenko

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New materials and sensors for semiconductor gas analysis by I. A. Kirovskaya, T. A. Kirovskaya, A. O. Ekkert

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Flow cell for operando X-ray photon-in-photon-out studies on photo-electrochemical thin film devices [version 2; peer review: 2 approved] by Philipp Jäker, Till Kyburz, Dino Aegerter, Rea Fonjallaz, Roman Städler, Dorota Koziej, Blanka Detlefs

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New materials — primary converters of semiconductor measuring cells based on InAs-CdTe system by I. A. Kirovskaya, E. N. Kopylova, E. V. Mironova, A. O. Ekkert, R. V. Ekkert, O. V. Kropotin, V. I. Krasheninin, Yu. I. Matyash

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