Comprehensive Study of Inversion Capacitance in Metal-Insulator-Semiconductor Capacitor With Existing Oxide Charges by Kung-Chu Chen, Kuan-Wun Lin, Sung-Wei Huang, Jian-Yu Lin, Jenn-Gwo Hwu

Subjects: “…metal-insulator-semiconductor (MIS)…”
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Role of Schottky Barrier Height Modulation on the Reverse Bias Current Behavior of MIS(p) Tunnel Diodes by Kung-Chu Chen, Kuan-Wun Lin, Jenn-Gwo Hwu

Subjects: “…Metal-insulator-semiconductor (MIS)…”
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Edge-Etched Al₂O₃ Dielectric as Charge Storage Region in a Coupled MIS Tunnel Diode Sensor by Bo-Jyun Chen, Jenn-Gwo Hwu

Subjects: “…Metal–insulator–semiconductor (MIS)…”
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Silicon-Carbide (SiC) Nanocrystal Technology and Characterization and Its Applications in Memory Structures by Andrzej Mazurak, Robert Mroczyński, David Beke, Adam Gali

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Graphitic Carbon Nitride (g-C₃N₄)/Al₂O₃ Heterostructure as Double Dielectric: A Comparative Study in MIS Based on a-IGZO by Purna Chandra Patra, Y. N. Mohapatra

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Hf-Based and Zr-Based Charge Trapping Layer Engineering for E-Mode GaN MIS-HEMT Using Ferroelectric Charge Trap Gate Stack by Jui-Sheng Wu, Chih-Chieh Lee, Chia-Hsun Wu, Cheng-Jun Huang, Yan-Kui Liang, You-Chen Weng, Edward Yi Chang

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