Advanced Metrology : Freeform Surfaces / by Jiang, Xiangqian, author 651623, Scott, Paul J., author 651624, ScienceDirect (Online service) 7722

Subjects: “…Metrology…”
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Metrological problems in the study of weapon systems by Maciej Dorczuk, Przemysław Wachowiak

Subjects: “…metrology…”
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Brief overview of the future of metrology by Federico Grasso Toro, Hugo Lehmann

Subjects: “…Digital metrology…”
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A Novel Measurement Standard for Surface Roughness on Involute Gears by Felix Steinmeyer, Dorothee Hüser, Rudolf Meeß, Martin Stein

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Heisenberg scaling precision in multi-mode distributed quantum metrology by Giovanni Gramegna, Danilo Triggiani, Paolo Facchi, Frank A Narducci, Vincenzo Tamma

Subjects: “…quantum metrology…”
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A brief history of metrology: past, present, and future by Fanton Jean-Pierre

Subjects: “…Metrology history…”
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EURAMET EMN-Q: The European metrology network for quantum technologies by Ivo Pietro Degiovanni, Marco Gramegna, Sébastien Bize, Hansjörg Scherer, Christopher Chunnilall

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MEASUREMENT UNCERTAINTY IN LEGAL METROLOGY by Bogdan-Gabriel Duță, Ionut Banu, Tania-Ioana Cimpeanu, Gabriela Bucur

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Ultra-fast materials metrology / by 210677 Horn, Alexander

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Principles and practices of measurement and metrology / by 492542 Vikram Sharma

Subjects: “…Metrology…”

Speckle metrology / by Erf, Robert K.

Subjects: “…Speckle metrology…”

Evaluating measurement accuracy : a practical approach / by 512446 Rabinovich, S. G.

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Advances in speckle metrology and related techniques / by Kaufmann, Guillermo H.

Subjects: “…Speckle metrology…”

You Talk, We Understand—The Importance of a Common Language of Measurement by Vicki J Barwick

Subjects: “…metrology…”
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A Unified Theory for 3D Gear and Thread Metrology by Martin Stein, Frank Keller, Anita Przyklenk

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Design and Implementation of Digital Calibration Certificate for RFID Tag Storage by Kan Kan, Shuaizhe Wang, Zilong Liu, Xingchuang Xiong

Subjects: “…metrology…”
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Metrology in industry : the key for quality / by College francais de metrologie

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Handbook of optical metrology : principles and applications / by Yoshizawa, Toru

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Kajian terhadap rekabentuk alat CMW 20 serta keupayaannya mengukur jarak dekat / by Ahmad Zawawi Kamaruldin, author, Fakulti Geoinformasi dan Harta Tanah

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Signal Transforms in Dynamic Measurements / by Layer, Edward, 1942- author., Tomczyk, Krzysztof, author

Subjects: “…Metrology.…”