Investigation of Radiation Hardened TFET SRAM Cell for Mitigation of Single Event Upset by M. Pown, B. Lakshmi

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A system-level method for hardening phase-locked loop to single-event effects by Bin Liang, Xinyu Xu, Hengzhou Yuan, Jianjun Chen, Deng Luo, Yaqing Chi, Hanhan Sun

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Radiation Hardened NULL Convention Logic Asynchronous Circuit Design by Liang Zhou, Scott C. Smith, Jia Di

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Mitigation and Predictive Assessment of SET Immunity of Digital Logic Circuits for Space Missions by Ygor Q. Aguiar, Frédéric Wrobel, Jean-Luc Autran, Paul Leroux, Frédéric Saigné, Vincent Pouget, Antoine D. Touboul

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Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits by Md Arifur R. Sarker, Seungwoo Jung, Adrian Ildefonso, Ani Khachatrian, Stephen P. Buchner, Dale McMorrow, Pauline Paki, John D. Cressler, Ickhyun Song

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Design of Static Random-Access Memory Cell for Fault Tolerant Digital System by Taehwan Yoon, Jihwan Park, Hanwool Jeong

Subjects: “…radiation-hardened by design…”
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A Single-Event-Hardened Scheme of Phase-Locked Loop Microsystems for Aerospace Applications by Qi Xiang, Hongxia Liu, Yulun Zhou

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Development and application of a radiation effect evaluation method of aerospace integrated circuits for radiation hardened by design by ZHENG Hongchao, WANG Liang, LI Zhe, GUO Gang, ZHAO Yuanfu

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3D Numerical Simulation of a Z Gate Layout MOSFET for Radiation Tolerance by Ying Wang, Chan Shan, Wei Piao, Xing-ji Li, Jian-qun Yang, Fei Cao, Cheng-hao Yu

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Radiation-hardened-by-design preamplifier with binary weighted current source for radiation detector by Minuk Seung, Jong-Gyun Choi, Woo-young Choi, Inyong Kwon

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