Experimental approaches to assess the effect of composition of abrasives in the cause of dental microwear by Matthew C. Mihlbachler, Frances Rusnack, Brian Lee Beatty

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Surface Metrology Principles for Snow and Ice Friction Studies by Christopher A. Brown

Subjects: “…surface metrology…”
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Non-linear least squares fitting of Bézier surfaces to unstructured point clouds by Joseph Lifton, Tong Liu, John McBride

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Qualifying parabolic mirrors with deflectometry by Burke J., Li W., Heimsath A., von Kopylow C., Bergmann R. B.

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Optical and XCT measurement of additively manufactured surfaces by WEIDONG LIU

Subjects: “…Surface metrology…”
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SurfILE: An Open-Source Python Package for Surface Topography Analysis by Andrea Giura, Massimo Zucco, Luigi Ribotta

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Metrological Aspects of Surface Topographies Produced by Different Machining Operations Regarding Their Potential Functionality by Żak Krzysztof, Grzesik Wit

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A low-cost, simple optical setup for a fast scatterometry surface roughness measurements with nanometric precision by D. Kucharski, H. Zdunek

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Analysis of the Visual Appearance of AISI 430 Ferritic Stainless Steel Flat Sheets Manufactured by Cool Rolling and Bright Annealing by Juan M. González-Leal, Enrique Gallero, Eduardo Blanco, Milagrosa Ramírez del Solar, Andrés Nuñez, Juan F. Almagro

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In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope by Higinio González-Jorge, Victor Alvarez-Valado, Jose Luis Valencia, Soledad Torres

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Practical Approaches for Determining the Structural Resolution Capability of X-ray Computed Tomography Measurement Tasks by Matthias Busch, Tino Hausotte

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Thickness Effect on Some Physical Properties of RF Sputtered ZnTe Thin Films for Potential Photovoltaic Applications by Dumitru Manica, Vlad-Andrei Antohe, Antoniu Moldovan, Rovena Pascu, Sorina Iftimie, Lucian Ion, Mirela Petruta Suchea, Ştefan Antohe

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Characterization of Soft Tooling Photopolymers and Processes for Micromixing Devices with Variable Cross-Section by J. Israel Martínez-López, Héctor Andrés Betancourt Cervantes, Luis Donaldo Cuevas Iturbe, Elisa Vázquez, Edisson A. Naula, Alejandro Martínez López, Héctor R. Siller, Christian Mendoza-Buenrostro, Ciro A. Rodríguez

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A Measurement System with High Precision and Large Range for Structured Surface Metrology Based on Atomic Force Microscope by Junjie Wu, Xiaoyu Cai, Jiasi Wei, Chen Wang, Yong Zhou, Kaixin Sun

Subjects: “…surface metrology…”
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Functional correlation surface texture / grip of a deposit : case of NiP by Levrel Enora, Binti Mohd Safie Siti Nursyafinaz, Malécot Pierrick, Lambert Virgile, Fontaine Michael, Hallez Loic, Lallemand Séverine

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Inshore Ship Detection Based on Multi-Modality Saliency for Synthetic Aperture Radar Images by Zhe Chen, Zhiquan Ding, Xiaoling Zhang, Xiaoting Wang, Yuanyuan Zhou

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An Isotropic Areal Filter Based on High-Order Thin-Plate Spline for Surface Metrology by Suichu Huang, Mingsi Tong, Wentao Huang, Xuezeng Zhao

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Progress in Multi-Physics Optical Diagnostic Technology Based on Light Field Imaging by Yu JI, Zhou ZHAO, Shengming XU, Chunhui YAO, Yulun He, Hua FANG, Peilin WU, Fei ZENG, Muku CHEN, Shengxian SHI

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A plateau-valley separation approach (PVSA) for reduction of the end-effect in surface metrology by Przemysław Podulka

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3D scanning of daguerreotypes by Diego Quintero Balbas, Luca Pezzati, Barbara Cattaneo, Valentina Righetti, Jana Striova

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