Showing 221 - 240 results of 1,667 for search '(((((cheers OR checkers) OR chee) OR (steer OR shear)) OR (cheer OR chenr)) OR (bears OR beams))*', query time: 0.28s Refine Results
  1. 221

    Ultrasonic welding of novel carbon/Elium® thermoplastic composites with flat and integrated energy directors : lap shear characterisation and fractographic investigation by Bhudolia, Somen K., Gohel, Goram, Kantipudi, Jayaram, Leong, Kah Fai, Jr., Robert J. Barsotti

    Published 2020
    “…The ED integrated configuration showed the best welding results with a lap shear strength of 18.68 MPa. The morphological assessment has shown significant plastic deformation of Elium® resin and the shear cusps formation, which enhances the welding strength. …”
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    Journal Article
  2. 222

    Functional amyloids in Pseudomonas aeruginosa may be involved in the sequestration of the quorum sensing molecules HHQ and PQS under high shear conditions. by Sia, Wan Rong.

    Published 2013
    “…Results from the investigations revealed that Fap binds to QS molecules at high affinities and was able to retain them under high shear force. Therefore, we propose that Fap has a functional role in sequestering QS molecules under high shear conditions.…”
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    Final Year Project (FYP)
  3. 223

    A KLF2-BMPER-Smad1/5 checkpoint regulates high fluid shear stress-mediated artery remodeling by Deng, H, Zhang, J, Wang, Y, Joshi, D, Pi, X, De Val, S, Schwartz, MA

    Published 2024
    “…Endothelial cells sense fluid shear stress (FSS) from blood flow to maintain FSS within a narrow range in healthy vessels. …”
    Journal article
  4. 224
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    Experimental study on exterior precast RC beam to CECFST column joint under lateral cyclic loading by Ho, Brandon Lye Kiat

    Published 2023
    “…Beam-column joints (BCJ) play an integral role in the reinforced concrete (RC) frame structure. …”
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    Final Year Project (FYP)
  6. 226

    Electron-beam radiation induced degradation of silicon nitride and its impact to semiconductor failure analysis by TEM by Liu, Binghai, Dong, Zhi Li, Hua, Younan, Fu, Chao, Li, Xiaomin, Tan, Pik Kee, Zhao, Yuzhe

    Published 2019
    “…By in-situ transmission electron microscopy (TEM), we performed a detailed study on the electron-beam radiation damage to nanostructured silicon nitride thin-film process layers in a typical semiconductor NVM device. …”
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    Journal Article
  7. 227
  8. 228

    Dynamic properties of high-Tc superconducting nano-junctions made with a focused helium ion beam by Couëdo, François, Amari, Paul, Feuillet-Palma, Cheryl, Ulysse, Christian, Srivastava, Yogesh Kumar, Singh, Ranjan, Bergeal, Nicolas, Lesueur, Jérôme

    Published 2021
    “…Here we report on noise properties at RF frequencies of recently introduced high-Tc Josephson nano-junctions fabricated by mean of a Helium ion beam focused at sub-nanometer scale on a YBa2Cu3O7 thin film. …”
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    Journal Article
  9. 229

    A unified approach for austenitic and ferritic stainless steel CHS beam-columns subjected to eccentric loading by Ma, You-Xin, Tan, Kang Hai

    Published 2022
    “…The novelty of this paper is to present a closed-form solution for generating axial-load–end-moment interaction curves of the stainless steel CHS beam–column by combining the normalised M–N–Φ equation with a general beam–column equation. …”
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    Journal Article
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    A quick design tool for the design of beam‐column member and base plate using MS Excel by Kong, Qingyang.

    Published 2013
    “…This report is for a quick design tool developed for structure designers or engineers to design Circular Hollow Section (CHS) beam-column members and base plates with “I” section, Rectangular Hollow Section (RHS), Circular Hollow Section (CHS), and Square Hollow Section (SHS). …”
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    Final Year Project (FYP)
  13. 233

    Studies on GaN based HEMT heterostructures on 100-mm silicon grown by molecular beam epitaxy by Ravikiran Lingaparthi

    Published 2015
    “…Using cross sectional transmission electron microscope (TEM) analysis, bending and looping of dislocation at AlGaN/2nd AlN and AlGaN/2nd GaN interfaces was attributed to the high relaxation of 2nd GaN. Weak beam dark field images showed extra tilt in the crystallites at AlGaN/2nd GaN interface, which was attributed to the increased stress mitigation and compressive bowing of the wafer. …”
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    Thesis
  14. 234

    InGaP grown on Ge (100) by molecular beam epitaxy: a spectroscopic ellipsometry study by D’Costa, Vijay Richard, Loke, Wan Khai, Zhou, Qian, Yoon, Soon Fatt, Yeo, Yee-Chia

    Published 2016
    “…The alloys were grown on Ge (100) substrate by solid-source molecular beam epitaxy. The far-infrared dielectric function reveals two absorption peaks that can be attributed to InP- and GaP-like vibrational modes. …”
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    Journal Article
  15. 235

    Magnetohydrodynamic motions of oldroyd-b fluids in infinite circular cylinder that applies longitudinal shear stresses to the fluid or rotates around its axis by Vieru, Dumitru, Fetecau, Constantin, Zulkhibri, Ismail

    Published 2024
    “…General expressions are firstly established for shear stress and velocity fields corresponding to the motion induced by longitudinal shear stress on the boundary. …”
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    Article
  16. 236
  17. 237

    Experimental, numerical study and design of concrete-encased concrete-filled steel tube columns and beam-column joints by Ma, Youxin

    Published 2022
    “…After a comprehensive assessment of the seismic performance of concrete beam-to-CECFST column joints, a simplified model was then proposed to capture the shear behaviour of such joints. …”
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    Thesis-Doctor of Philosophy
  18. 238
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    Effect of build height on the microstructure and mechanical properties of electron beam melted Ti-6Al-4V by Mohamed Harris Mohamed Ibrahim

    Published 2021
    “…Currently the additive manufacturing (AM) process which is also known as 3D printing is being progressively adopted for producing TI-6Al-4V parts, primarily because of its ability to produce complex parts at a reduced cost. Electron Beam Melting (EBM) is the most common AM method used to produce TI-6Al-4V due to the vacuum conditions during the process. …”
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    Final Year Project (FYP)