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261
Whole field curvature and residual stress determination of silicon wafers by reflectometry
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Conference Paper -
262
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263
Refractive index sensor based on θ-shaped microfiber resonator and Vernier effect
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Conference Paper -
264
Improving shape context using geodesic information and reflection invariance
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Conference Paper -
265
White light single-shot interferometry with colour CCD camera for optical inspection of microsystems
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266
The focusing property of the spiral Fibonacci zone plate
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Conference Paper -
267
Miniature photonic crystal optical fiber humidity sensor based on polyvinyl alcohol
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Conference Paper -
268
Rapid defect detections of bonded wafer using near infrared polariscope
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269
Experimental investigation of fatigue in a cantilever energy harvesting beam
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270
Instrumentation challenges of a pushbroom hyperspectral imaging system for currency counterfeit applications
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Conference Paper -
271
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272
On the use of physics in machine learning for manufacturing process inspection
Published 2024“…SPIE Optical Metrology, 2023, Munich, Germany…”
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273
Offset-16QAM-based coherent WDM with multi-carrier group detection
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Conference Paper -
274
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275
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276
Photoacoustic imaging of live chicken embryo at multiple developmental stages
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277
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278
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279
Z2 quantum memory implemented on circuit quantum electrodynamics
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Conference Paper -
280
Shape simplification through polygonal approximation in the fourier domain
Published 2015Get full text
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Conference Paper