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  1. 441

    One-stop measurement model for fast and accurate tensor display characterization by Surman, Phil, Wang, Shizheng, Yuan, Junsong, Zheng, Yuanjin

    Published 2019
    “…The technique exploits the fact that when spatial resolution of a sinusoidal grating pattern is halved, its contrast ratio is reduced by a known proportion. …”
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    Journal Article
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