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    Plasma enhanced chemical vapor deposition growth of vanadium dioxide by LEE, Boon Peng

    Published 2019
    “…The morphology of the samples was studied and analyzed using Atomic force microcopy (AFM) and scanning electron microscopy (SEM). The chemical composition and transmittance are examined using Energy dispersive X-ray spectroscopy (EDX) and UV-Vis spectroscopy (UV-Vis). …”
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    Final Year Project (FYP)
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