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301
Preparation and characterization of physical properties of Durian skin fibers biocomposite
Published 2012“…This paper present the physical behaviour, chemical structure and crystallinity of the fibres, as observed by environmental scanning electron microscope (ESEM), Fourier transform infrared (FTIR) and Xray diffraction (XRD). …”
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Article -
302
Development of a position detection technique for UWB chipless RFID tagged object
Published 2013“…Two microwave antennas for narrow bandwidth beam used for scanning purpose. The antennas are mounted on two digital stepper motor driven systems. …”
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Proceeding Paper -
303
Preparation of Dense Biphasic Calcium Phosphate Ceramics using Eggshell Derived Nanopowders
Published 2012“…X-ray diffraction analysis of nanopowders revealed the existences of hydroxyapatite (HA) as the main phase, with β-tricalcium phosphate (β-TCP) and calcium pyrophosphate (CPP) as the second phases. Scanning electron microscopy was done to examine the morphology of dense BCP bodies. …”
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Article -
304
A comparison of four pre-processing attenuation correction methods for single photon emission computed tomography
Published 1998“…In this work, an attempt is made to implement four existing pre-processing (arithmetic mean-based and geometric mean based) attenuation correction methods, and to test via gathering the data by scanning a cylindrical phantom over 360 degrees. The phantom was filled with water and Tc-99m solution was uniformly distributed. …”
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Article -
305
Synthesis of carbon nanotube and Its potential application in protein purification by using skim latex serum
Published 2009“…The morphology and the structure of CNTs were characterized using field emission scanning electron microscope (FSEM) and transmission electron microscope (TEM). …”
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Proceeding Paper -
306
Novel nanofabrication process of oxide patterns using AFM in low operating temperature: a promising lithographic tool for future molecular electronics
Published 2007“…In this report, a low temperature operation of an atomic force microscope (AFM) was used to condense ambient humidity to perform a thin frozen water layer covering a silicon wafer surface. A scanning probe was contacted with the layer and a zero bias voltage was applied to the probe tip. …”
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Proceeding Paper -
307
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308
The spectra of manganese and zirconium in the wavelength region 0.8 μm [microns] - 2.6 μm [microns or micrometres]
Published 1980“…In this investigation, Zeeman patterns were scanned using Fabry-Perot interferometer as a pressure-scanning spectrometer, and infrared Ebert mounting grating spectrometer as a monochromator. …”
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Thesis -
309
Selective recognition of bisphenol a using molecularly imprinted polymer based on choline chloride-methacrylic acid deep eutectic solvent monomer: Synthesis characterization and ad...
Published 2023“…Fourier transform infrared spectrometry (FTIR), scanning electron microscopy (SEM), thermogravimetric analysis (TGA), and differential scanning calorimetry (DSC) were used to characterize the synthesized polymers. …”
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Article -
310
Study on the effect of zeolite rice husk particles on polysulfone membrane
Published 2015“…Physical characterization were carried out using thermogravimetric analysis (TGA), scanning electron microscope (SEM), porosity, tensile strength, atomic force microscope (AFM) and water contact angle (CA). …”
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Thesis -
311
Modeling electric field distribution on insulator under electron bombardment in vacuum
Published 2010“…This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. …”
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Article -
312
Experimental analysis and simulation of catalytic converters
Published 2011“…After completing the test, the converters were cut to extract the substrate or 'honeycomb' inside the housing and being analyzed for microstructure and materials composition using Scanning Electron Microscopy (SEM) and Energy Dispersive Analysis (EDX). …”
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Book Chapter -
313
Identification of marine sand-dwelling dinoflagellates in Dinawan Island, Sabah
Published 2011“…Samples were identified using light microscopy (LM) and Scanning Electron Microscopy (SEM). Sixteen dinoflagellates species have been identified including 4 potential toxic species i.e. …”
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Article -
314
Focused ion beam machining of silicon
Published 2002“…The surface integrity and machined features were measured with a scanning probe microscope. Statistical models were established to predict the sputtered depths and MRRs. …”
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Article -
315
Micromilling of tungsten carbide using focused ion beam
Published 2005“…All the experiments were carried out with dry micromilling using serpentine scanning mode. Empirical models were formulated to predict the sputtered depth which increased with higher ion dose significantly but the relationship was nonlinear. …”
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Proceeding Paper -
316
Geometrical integrity of microholes produced by micro-EDM
Published 2008“…At first, an experimental process was developed to open the internal geometry of the holes and then characterized the geometrical integrity and surface texture using scanning electron microscope (SEM) and atomic force microscope (AFM).…”
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Monograph -
317
Thermal, mechanical, and rheological properties of biodegradable polybutylene succinate/carbon nanotubes nanocomposites
Published 2010“…Biodegradable poly(butylene succinate)/carbon nanotubes nanocomposites were prepared by melt mixing process and the influence of carbon nanotubes on the properties of the nanocomposites was investigated. Differential scanning calorimetry showed that crystallization temperature (Tc) increase with increasing carbon nanotube content. …”
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Article -
318
Investigation of recast layer of non-conductive ceramic due to micro-EDM
Published 2014“…The recast layer thickness was observed using scanning electron microscope and its hardness was measured using micro-Vickers hardness tester. …”
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Article -
319
Modeling electric field distribution on insulator under electron bombardment in vacuum
Published 2009“…This report gives a simple explanation on this phenomenon. A scanning electron microscope was used not only as a tool to produce energetic electron beam to charge an insulator without metallic coating and to produce a surface discharging (surface breakdown/flashover) but also to observe the visible charging and discharging on the sample surface. …”
Get full text
Proceeding Paper -
320
Physical properties of electroless nickel-tungsten coating on mild steels obtained from acetic bath
Published 2015“…The influence of sodium acetate and sodium tungstate on deposits was investigated and characterized using scanning electron microscope (SEM), energy dispersive X-ray spectrometer (EDX) and x-ray diffraction (XRD) to assess the phase, content and microstructure features. …”
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Article