Showing 221 - 240 results of 5,572 for search '((spinnata OR ((peng OR bina) OR (sping OR sspinn))) OR ((shin OR than) OR (sbinal OR pin)))', query time: 0.20s Refine Results
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    On the edge‐toughness of a graph. II by Peng, Y.H., Tay, T.S.

    Published 1993
    “…We also give a simpler proof to the following result of Peng et al.: For any positive integers r, s satisfying r/2 < s ≤ r, there exists an infinite family of graphs such that for each graph G in the family, λ(G) = r (where λ(G) is the edge‐connectivity of G) T1(G) = s, and G can be factored into s spanning trees.…”
    Article
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    Dielectric dynamics of epitaxial BiFeO3 thin films by Ren, Peng, Liu, Peng, Xia, Bin, Zou, Xi, You, Lu, Wang, Junling, Wang, Lan

    Published 2013
    “…The dielectric constants obtained from the constant phase elements (CPEs) are more than 400 even at low temperatures. Finally, the physical significances of the CPE model are discussed.…”
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    Journal Article
  8. 228

    Engineering pressure retarded osmosis membrane bioreactor (PRO-MBR) for simultaneous water and energy recovery from municipal wastewater by Liu, Shuyue, Song, Weilong, Meng, Manli, Xie, Ming, She, Qianhong, Zhao, Pin, Wang, Xinhua

    Published 2023
    “…Membrane orientation largely determined the performance of PRO-MBR, higher power density was achieved in AL-DS orientation (peak value of 3.4 W/m2) than that in AL-FS orientation (peak value of 1.4 W/m2). …”
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    Journal Article
  9. 229

    Producing microscale Ge textures via titanium nitride- and nickel-assisted chemical etching with CMOS-compatibiliyty by Liao, Yikai, Shin, Sang-Ho, Jin, Yuhao, Wang, Qi Jie, Kim, Munho

    Published 2022
    “…Schottky contact barrier of metal catalyst with Ge is also investigated indicating similar hole injection efficiency among TiN, Ni, and Ti/Ni with Ge junction due to strong Fermi level pinning effect. The TiN- and Ni-assisted chemical etching of Ge shed light on CMOS-compatible Ge-based photonic and optoelectronic applications.…”
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    In-situ monitoring of oil emulsion fouling in ultrafiltration via electrical impedance spectroscopy (EIS): influence of surfactant by Tian, Ju, Trinh, Thien An, Kalyan, Muppalla Naga, Ho, Jia Shin, Chew, Jia Wei

    Published 2022
    “…As filtration progressed beyond 0.5 h, the conductance and capacitance of the membrane skin layer in the case of CTAB-stabilized oil emulsions became respectively higher and lower than that in the case of CTAB alone, signifying that the deposition of oil emulsions had become more dominant than that of surfactants. …”
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