Showing 141 - 160 results of 320 for search '(farr OR (farry OR carry)) 40', query time: 0.11s Refine Results
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    Electrical characterization of bias temperature instability in MOSFETs with the ultrathin SiON and la-doped HfSiO gate dielectrics by Du, Guoan.

    Published 2013
    “…The minimum measurement time of UFS can be as short as 40 ns, which is one of the fastest measurement methods for BTI characterization. …”
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    Thesis
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    3D Modelling Using Machine Learning Technique by Zhao, Haolong

    Published 2018
    “…Test Results of two dataset, ShapeNet used in previous, and ModelNet40, extra dataset rendered in this project are shown and discussed in the report, too. …”
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    Final Year Project (FYP)
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    Investigation of the avalanche multiplication characteristics in advanced avalanche photodiodes (APDs) by Toh, Rui Tze.

    Published 2012
    “…Device simulation based on the Random Path Length model is carried out using a software developed based on the NET4.0 framework with C# in this project. …”
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    Final Year Project (FYP)
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