3D model reconstruction of damaged parts in an automated remanufacturing process using additive manufacturing technology by Aprilia

Subjects: “…Engineering::Manufacturing::Metrology…”
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A computer vision and smartphone-based tool for onsite color correction and dimensional measurements by Xiong, Wenxi

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Phase difference measurements through means of digital sampling by Yeo, Qian.

“…This report provides a technical details of the student's Final Year Project being attached to A*STAR National Metrology Centre, working on the topic on “Phase difference measurements through means of digital sampling.” …”
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Whole field curvature and residual stress determination of silicon wafers by reflectometry by Ng, Chi Seng, Asundi, Anand Krishna

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Rapid defect detections of bonded wafer using near infrared polariscope by Asundi, Anand Krishna, Ng, Chi Seng

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Characterization of engine liner topography by Maung Pho La Minn.

“…The characterization of engine liner topography has been a topic of considerable research in manufacturing, tribology, surface metrology and auto-mobile engineering for the past 30 years. …”
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Inspection with polarised light by Alasdair Muntz

“…The project investigated the use and limitations of the polariscope equipment used by the university, currently in the Metrology room of the COLE laboratory, in inspection and stress analysis of transparent plastic specimens. …”
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Achieving the multiparameter quantum Cramér-Rao bound with antiunitary symmetry by Wang, B, Zheng, K, Xie, Q, Zhang, A, Xu, L, Zhang, L

“…The estimation of multiple parameters is a ubiquitous requirement in many quantum metrology applications. However, achieving the ultimate precision limit, i.e., the quantum Cramér-Rao bound, becomes challenging in these scenarios compared to single parameter estimation. …”

Windowed Fourier ridges for demodulation of carrier fringe patterns with nonlinearity : a theoretical analysis by Agarwal, Nimisha, Wang, Chenxing, Qian, Kemao

“…Accurately extracting phase or phase derivative is the most important requirement in optical metrology. However, in practice, there are many error sources, among which nonlinear distortion in fringe patterns is often encountered. …”
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On the use of physics in machine learning for manufacturing process inspection by Barbastathis, George, Zhang, Qihang, Pandit, Ajinkya, Tang, Wenlong, Papageorgiou, Charles, Braatz, Richard, Myerson, Allan S, Tan, Bingyao, Schmetterer, Leopold

“…SPIE Optical Metrology, 2023, Munich, Germany…”
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Optical differentiators and integrators : recent advances and applications, and enormous potential applications by Ngo, Nam Quoc

“…The existing applications of ODs include ultrawideband communications (UWB), optical metrology, dispersion-managed soliton pulse generation for ultrahigh-speed soliton transmission systems, ultrashort flat-top pulse generation for the demultiplexing of 640 Gbit/s data in ultrahigh-speed optical communication systems, and optical computing. …”
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Multiple wavelength fringe analysis for surface profile measurements by Upputuri, Paul Kumar, Pramanik, Manojit

“…Interferometry has been widely used for surface metrology because of their precision, reliability, and versatility. …”
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Mechanical properties and deformation behaviour of early age concrete in the context of digital construction by Panda, Biranchi, Lim, Jian Hui, Tan, Ming Jen

“…Experimental investigations were carried out to measure green strength and stiffness of fresh fly ash-cement mortar with applied 3D optical metrology. The compressive green strength was linked with material yield strength evolution and later, modified with nanoclay for higher buildability properties. …”
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Opportunities for machine learning to accelerate halide-perovskite commercialization and scale-up by Kumar, Rishi E., Tiihonen, Armi, Sun, Shijing, Fenning, David P., Liu, Zhe, Buonassisi, Tonio

“…In this perspective, we review practical challenges hindering the commercialization of halide perovskites, and discuss how machine-learning (ML) tools could help: (1) active-learning algorithms that blend institutional knowledge and human expertise could help stabilize and rapidly update baseline manufacturing processes; (2) ML-powered metrology, including computer imaging, could help narrow the performance gap between large- and small-area devices; and (3) inference methods could help accelerate root-cause analysis by reconciling multiple data streams and simulations, focusing research effort on areas with highest probability for improvement. …”
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Measurement of buried undercut structures in microfluidic devices by laser fluorescent confocal microscopy by Li, Shiguang, Liu, Jing, Nguyen, Nam-Trung, Fang, Zhong Ping, Yoon, Soon Fatt

“…Measuring buried, undercut microstructures is a challenging task in metrology. These structures are usually characterized by measuring their cross sections after physically cutting the samples. …”
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Digital wavefront recording, reconstruction and 3D display by Qian, Kemao

“…The importance of the project is from the fact that phase of optical wavefronts are more important in precision metrology, though we sense the amplitude of optical wavefronts every day. …”
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White light single-shot interferometry with colour CCD camera for optical inspection of microsystems by Upputuri, Paul Kumar, Pramanik, Manojit, Nandigana, Krishna Mohan, Prasad, Mahendra

“…White light interferometry is a well-established optical tool for surface metrology of reflective samples. In this work, we discuss a single-shot white light interferometer based on single-chip color CCD camera and Hilbert transformation. …”
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Dynamic characterization of MEMS diaphragm using time averaged in-line digital holography by Miao, Jianmin, Singh, Vijay Raj, Wang, Zhihong, Hegde, Gopalkrishna M., Anand, Asundi

“…A simple and robust tool for dynamic optical metrology of MEMS devices and micro-objects using time averaged in-line digital holography is thus proposed.…”
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Giant photonic spin Hall effect empowered by polarization-dependent quasibound states in the continuum in compound grating waveguide structures by Wu, Feng, Liu, Tingting, Long, Yang, Xiao, Shuyuan, Chen, Gengyan

“…The photonic spin Hall effect (PSHE) plays an important role in both fundamental science and precision metrology. In this paper, we theoretically propose a polarization-dependent bound state in the continuum (BIC) in a compound grating waveguide structure based on the selectable guided resonance at near-infrared wavelengths. …”
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Review of mid-infrared mode-locked laser sources in the 2.0 μ m–3.5 μ m spectral region by Ma, Jie, Qin, Zhipeng, Xie, Guoqiang, Qian, Liejia, Tang, Dingyuan

“…These achievements open new opportunities for applications in areas such as molecular spectroscopy, frequency metrology, material processing, and medical diagnostics and treatment. …”
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