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Defect engineering in two common types of dielectric materials for electromagnetic absorption applications
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Digital holographic microscopy for MEMS/MOEMS device inspection and complete characterization
Published 2015Get full text
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Boundary condition modifications of the Suzen-Huang plasma actuator model
Published 2014Get full text
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Noise reduction mechanisms of active noise barriers
Published 2013Get full text
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Failure mapping of adhesively bonded single lap joints : nondimensional analysis
Published 2014Get full text
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Scaling of near-wall flows in quasi-two-dimensional turbulent channels
Published 2014Get full text
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Journal Article