Search Results - London : INSPEC, Inc., :: UTM Library Massive Scholar Tracking

1

Microwave circuit theory and foundations of microwave metrology / by 458464 Engen, Glenn F.

Published 1992
“…London : INSPEC, Inc.,…”
2

Properties, growth and applications of diamond / by Nazare, Maria Helena, Neves, A. J., Institution of Electrical Engineers, INSPEC. EMIS Group

Published 2001
“…London, UK : INSPEC, Inc.…”