Showing 101 - 120 results of 390 for search 'New York IEEE', query time: 0.31s Refine Results
  1. 101
    Software engineering standards : ANSI/IEEE Stds 729-730, 828-830

    Software engineering standards : ANSI/IEEE Stds 729-730, 828-830

    Published 1984
    “…New York : IEEE,…”
  2. 102
    Proceedings of reliability physics /

    Proceedings of reliability physics / by Reliability Physics Symposium (14th : 1976 : Las Vegas, Nevada), Institute of Electrical and Electronics Engineers. Electron Divices Group, IEEE Reliability Group

    Published 1976
    “…New York : IEEE,…”
  3. 103
    Proceedings of reliability physics /

    Proceedings of reliability physics / by Reliability Physics Symposium (15th : 1977 : Las Vegas, Nevada), Institute of Electrical and Electronics Engineers. Electron Divices Group, IEEE Reliability Group

    Published 1977
    “…New York : IEEE,…”
  4. 104
    Decision and control

    Decision and control by IEEE Conference on Decision and Control (1975 : Houston, Texas), Institute of Electrical and Electronics Engineers

    Published 1975
    “…New York : IEEE,…”
  5. 105
    National electrical safety code

    National electrical safety code by 11255 IEEE

    Published 1983
    “…New York : IEEE,…”
  6. 106
    NESC handbook : development and application of the American National Standard, national electrical safety code, grounding rules, and parts 1, 2 and 3 /

    NESC handbook : development and application of the American National Standard, national electrical safety code, grounding rules, and parts 1, 2 and 3 / by 195799 Clapp, Allen L.

    Published 1984
    “…New York : IEEE,…”
  7. 107
    IEEE Applied Power Electronics Conference and Exposition (2nd : 1987 : San Diego, Calif) : Proceedings / [mikrofis]

    IEEE Applied Power Electronics Conference and Exposition (2nd : 1987 : San Diego, Calif) : Proceedings / [mikrofis]

    Published 1987
    “…New York : IEEE,…”
  8. 108
    IEEE Applied Power Electronics Conference and Exposition (3rd : 1988 : New Orleans, Louisiana) : Proceedings / [mikrofis]

    IEEE Applied Power Electronics Conference and Exposition (3rd : 1988 : New Orleans, Louisiana) : Proceedings / [mikrofis]

    Published 1988
    “…New York : IEEE,…”
  9. 109
    Neuro-vision systems : principles and applications /

    Neuro-vision systems : principles and applications / by Gupta, Madan M., Knopf, George K.

    Published 1994
    “…New York : IEEE,…”
  10. 110
    The probability tutoring book : an intuitive course for engineers and scientists (and everyone else!) /

    The probability tutoring book : an intuitive course for engineers and scientists (and everyone else!) / by 375976 Ash, Carol

    Published 1993
    “…New York : IEEE,…”
  11. 111
    IEEE transactions on applications and industry / [mikrofilem]

    IEEE transactions on applications and industry / [mikrofilem] by IEEE

    Published 1963
    “…New York : IEEE,…”
  12. 112
    Automatic test equipment : hardware, software, and management /

    Automatic test equipment : hardware, software, and management /

    Published 1974
    “…New York : IEEE,…”
  13. 113
    IMTC '85

    IMTC '85 by IEEE Instrumentation and Measurement Technology Conference (2nd : 1985 : Tampa, Fla.)

    Published 1985
    “…New York : IEEE,…”
  14. 114
    [Special power publication]

    [Special power publication] by Institute of Electrical and Electronics Engineers. Power Engineering Society

    Published 1973
    “…New York : IEEE,…”
  15. 115
    Proceedings of Southeastcon Region 3 Conference

    Proceedings of Southeastcon Region 3 Conference by 471268 Southeastcon Region 3 Conference (1974-), Institute of Electrical and Electronics Engineers

    Published 1974
    “…New York : IEEE,…”
  16. 116
    Proceedings of the reliability and maintainability symposium /

    Proceedings of the reliability and maintainability symposium / by Reliability and Maintainability Symposium (1975-), Institute of Electrical and Electronics Engineers

    Published 1975
    “…New York : IEEE,…”
  17. 117
    Multichip modules : systems advantages, major constructions, and materials technologies

    Multichip modules : systems advantages, major constructions, and materials technologies by 391896 Johnson, R. Wayne, Balde, John W., Teng, Robert K. F.

    Published 1991
    “…New York : IEEE,…”
  18. 118
    Reliability and maintainability

    Reliability and maintainability by Symposium on Reliability and Maintainability (1976 : Las Vegas, Nevada)

    Published 1976
    “…New York : IEEE,…”
  19. 119
    Software engineering

    Software engineering by National Conference on Software Engineering (1975 : Washington, DC)

    Published 1975
    “…New York : IEEE,…”
  20. 120
    Proceedings of the IEEE International Symposium on Electromagnetic Compatibility

    Proceedings of the IEEE International Symposium on Electromagnetic Compatibility by IEEE International Symposium on Electromagnetic Compatibility (1975-), Institute of Electrical and Electronics Engineers. Electromagnetic Compatibility Group

    Published 1975
    “…New York : IEEE,…”

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