BACKSCATTERED ELECTRON COMPOSITIONAL ANALYSIS OF INTERFACES IN BULK SPECIMENS USING A DECONVOLUTION TECHNIQUE by Wilshaw, P, Konkol, A, Booker, G

“…Publ by Inst of Physics Publ Ltd…”

QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON by Fell, T, Wilshaw, P

“…Publ by Inst of Physics Publ Ltd…”

ANALYSIS OF DEFECTS IN BULK SEMICONDUCTORS USING ELECTRON CHANNELING CONTRAST IMAGING by Czernuszka, J, Long, N, Hirsch, P

“…Publ by Inst of Physics Publ Ltd…”

GETTERING OF COPPER IN SILICON - PRECIPITATION AT EXTENDED SURFACE-DEFECTS by Decoteau, M, Wilshaw, P, Falster, R

“…Publ by Inst of Physics Publ Ltd…”

KrF pumped Raman lasers as X-ray laser drivers by Key, M, Harvey, E, Hirst, G, Hooker, C, Jacoby, J, Kodama, R, Lister, J, Norreys, P, Rodgers, P, Rose, S, Ross, I, Shaw, M, Tallents, G, Tragin, N

“…Publ by Inst of Physics Publ Ltd…”

Influence of surface cracks on Hertzian fracture by Warren, P, Hills, D, Roberts, S

“…Inst of Physics Publ Ltd…”