Single view metrology by Criminisi, A, Reid, I, Zisserman, A

Single view metrology by Criminisi, A, Reid, I, Zisserman, A

Quantum anomalous Hall effect for metrology by Huáng, NJ, Boland, JL, Fijalkowski, KM, Gould, C, Hesjedal, T, Kazakova, O, Kumar, S, Scherer, H

“…The quantum anomalous Hall effect (QAHE) in magnetic topological insulators offers great potential to revolutionize quantum electrical metrology by establishing primary resistance standards operating at zero external magnetic field and realizing a universal “quantum electrical metrology toolbox” that can perform quantum resistance, voltage, and current metrology in a single instrument. …”

In-line digital holography for dynamic metrology of MEMS by Singh, Vijay Raj, Anand, Asundi

“…In this letter, a lensless in-line digital holographic microscopy is presented for dynamic metrology of micro-electro-mechanical systems devices. …”
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Precision Metrology with Ytterbium Ions for New Physics Search by Kniazev, Evgenii

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SIMOX BOX metrology : using physical and electrical characterization by Yoon, Jung Uk, 1971-

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Power of one bit of quantum information in quantum metrology by Cable, Hugo, Gu, Mile, Modi, Kavan

Subjects: “…Quantum Metrology…”
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Surface metrology and optical properties of thin film shape memory alloys by Wu, Mingjie

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Subwavelength metrology of Al wire grating employing finite difference time domain method and Mueller matrix polarimeter by Adhikari, Achyut, Dev, Kapil, Asundi, Anand

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Temperature measurement in microfludic system by Lim, Yu Qian.

Subjects: “…DRNTU::Engineering::Manufacturing::Metrology…”
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Design of a precise electronic system for conductivity or resistivity measurement by Jin, Chi

Subjects: “…DRNTU::Engineering::Manufacturing::Metrology…”
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Advances in 3D optical profilometry by Huang, Lei

Subjects: “…DRNTU::Engineering::Manufacturing::Metrology…”
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Fixtured vibratory finishing of Ti-6Al-4V by Houmayune, Haja Abdul Jaafer.

Subjects: “…DRNTU::Engineering::Manufacturing::Metrology…”
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Direct fabrication of surface relief gratings by interferometric technique using femtosecond pulsed laser by Hee, Chia Wei

Subjects: “…DRNTU::Engineering::Manufacturing::Metrology…”
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On-line shape measurement using micro-optics by Li, Chongxiang

Subjects: “…DRNTU::Engineering::Manufacturing::Metrology…”
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Micro optical probe sensor (MOPS) for dynamic in plane displacement sensing by Luo, Xiaoming.

Subjects: “…DRNTU::Engineering::Manufacturing::Metrology…”
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Hybrid superplastic forming of magnesium alloys by Sze, Swai Ming

Subjects: “…DRNTU::Engineering::Manufacturing::Metrology…”
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Effect of oblique retroreflection from a vibrating mirror on laser Doppler shift by Agusanto, Kusuma, Lau, Gih-Keong, Liu, Ting, Zhu, Chuangui

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Efficient computation of the Nagaoka–Hayashi bound for multiparameter estimation with separable measurements by Conlon, Lorcán O., Suzuki, Jun, Lam, Ping Koy, Assad, Syed Muhamad

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Direction-division multiplexed holographic free-electron-driven light sources by Clarke, Brendan P., MacDonald, Kevin F., Zheludev, Nikolay I.

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