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Showing 1 - 1 results of 1 for search 'toledo, (ivan OR ((ian OR ((kian OR lian) OR kin)) OR (jktqkian OR ((jian OR tian) OR jin))))', query time: 0.18s Refine Results
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    Characterization of the junction leakage of Ti-capped Ni-silicided junctions

    Characterization of the junction leakage of Ti-capped Ni-silicided junctions by Lee, Pooi See, Pey, Kin Leong, Toledo, N. G.

    Published 2013
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    Journal Article

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