Dangos 1 - 2 canlyniadau o 2, amser ymholiad: 0.06e Mireinio'r Canlyniadau
  1. 1
    The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.

    The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. gan Tong, V, Jiang, J, Wilkinson, A, Britton, T

    Cyhoeddwyd 2015
    Journal article
  2. 2
    The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements

    The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements gan Tong, V, Jiang, J, Britton, B

    Cyhoeddwyd 2015
    Dataset

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