Εμφανίζονται 1 - 2 Αποτελέσματα από 2, χρόνος αναζήτησης: 0,04δλ Περιορισμός αποτελεσμάτων
  1. 1
    The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.

    The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. ανά Tong, V, Jiang, J, Wilkinson, A, Britton, T

    Έκδοση 2015
    Journal article
  2. 2
    The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements

    The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements ανά Tong, V, Jiang, J, Britton, B

    Έκδοση 2015
    Dataset

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