Leaganacha - The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. :: UTM Library Massive Scholar Tracking

1

$The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.$

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. de réir Tong, V, Jiang, J, Wilkinson, A, Britton, T

Foilsithe / Cruthaithe 2015

Journal article
2

$The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements$

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements de réir Tong, V, Jiang, J, Britton, B

Foilsithe / Cruthaithe 2015

Dataset