Versies - The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. :: UTM Library Massive Scholar Tracking

1

$The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.$

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. door Tong, V, Jiang, J, Wilkinson, A, Britton, T

Gepubliceerd in 2015

Journal article
2

$The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements$

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements door Tong, V, Jiang, J, Britton, B

Gepubliceerd in 2015

Dataset