Отображение 1 - 2 результаты of 2, время запроса: 0.04сек. Отмена результатов
  1. 1
    The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.

    The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. по Tong, V, Jiang, J, Wilkinson, A, Britton, T

    Опубликовано 2015
    Journal article
  2. 2
    The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements

    The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements по Tong, V, Jiang, J, Britton, B

    Опубликовано 2015
    Dataset

Инструменты поиска: