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The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
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Jahki (vuohččan ođđaseamos)
Jahki (vuohččan boarráseamos)
Luohkká
Dahkki
Bajilčálus
1
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
Dahkki
Tong, V
,
Jiang, J
,
Wilkinson, A
,
Britton, T
Almmustuhtton 2015
Journal article
2
The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements
Dahkki
Tong, V
,
Jiang, J
,
Britton, B
Almmustuhtton 2015
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Organisašuvdna
University of Oxford
2 bohtosa
2
Materiálatiipa
Dataset
1 bohtosa
1
Journal article
1 bohtosa
1
Dahkki
Jiang, J
2 bohtosa
2
Tong, V
2 bohtosa
2
Wilkinson, A
2 bohtosa
2
Britton, B
1 bohtosa
1
Britton, T
1 bohtosa
1
Giella
English
2 bohtosa
2
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