Версії - The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. :: UTM Library Massive Scholar Tracking

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$The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.$

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements. за авторством Tong, V, Jiang, J, Wilkinson, A, Britton, T

Опубліковано 2015

Journal article
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$The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements$

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements за авторством Tong, V, Jiang, J, Britton, B

Опубліковано 2015

Dataset