সংস্করণ - "Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction. :: UTM Library Massive Scholar Tracking

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"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction. অনুযায়ী Kirkland, A, Meyer, R

প্রকাশিত 2004

Journal article
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"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction অনুযায়ী Kirkland, A, Meyer, R

প্রকাশিত 2004

Journal article