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  1. 1
    "Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.

    "Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction. מאת Kirkland, A, Meyer, R

    יצא לאור 2004
    Journal article
  2. 2
    "Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction

    "Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction מאת Kirkland, A, Meyer, R

    יצא לאור 2004
    Journal article

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