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  1. 1
    Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system

    Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system af Langford, R, Huang, Y, Lozano-Perez, S, Titchmarsh, J, Petford-Long, A

    Udgivet 2001
    Journal article
  2. 2
    Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system

    Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system af Langford, R, Huang, Y, Lozano-Perez, S, Titchmarsh, J

    Udgivet 2001
    Journal article

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