Версії - Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system :: UTM Library Massive Scholar Tracking

1

Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system за авторством Langford, R, Huang, Y, Lozano-Perez, S, Titchmarsh, J, Petford-Long, A

Опубліковано 2001

Journal article
2

Preparation of site specific transmission electron microscopy plan-view specimens using a focused ion beam system за авторством Langford, R, Huang, Y, Lozano-Perez, S, Titchmarsh, J

Опубліковано 2001

Journal article