Showing 1 - 7 results of 7 for search 'E. Korpela', query time: 0.05s
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Thermal and Structural Analysis of FIMS Grating by K.-I. Seon, I.-S. Yuk, K.-S. Ryu, J.-H. Park, K. Kang, H. Jin, U.-W. Nam, W. Han, K.-W. Min, W.-B. Lee, J. Edelstein, E. Korpela
Published 2001-06-01
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Sensitivity Calibration of Far-Ultraviolet Imaging Spectrograph by I. -J. Kim, K. -I. Seon, I.-S. Yuk, U.-W. Nam, H. Jin, J.-H. Park, K.-S. Ryu, D.-H. Lee, W. Han, K.-W. Min, J. Edelstein, E. Korpela
Published 2004-12-01
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3
Attitude and Exposure Corrections of FIMS Data by K.-I. Seon, I.-S. Yuk, K.-S. Ryu, D.-H. Lee, J.-H. Park, H. Jin, J.-H. Shinn, U.-W. Nam, W. Han, K. Min, E. Korpela, K. Nishikida, J. Edelstein
Published 2004-12-01
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4
Thermal Analysis of FIMS TDC and LVPS Electronic Boards by K.-I. Seon, I.-S. Yuk, U.-W. Nam, H. Jin, J.-H. Park, J.-G. Rhee, K.-S. Ryu, D.-H. Lee, H.-S. Oh, K.-K. Kong, W. Han, K.-W. Min, J. Edelstein, E. Korpela
Published 2002-12-01
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5
Error Budget Analysis of FIMS Optical System by K.-I. Seon, I.-S. Yuk, K.-S. Ryu, J.-H. Park, H. Jin, J.-H. Seon, S.-H. Oh, J.-G. Rhee, D.-H. Lee, U.-W. Nam, W. Han, K.-W, Min, W.-B. Lee, J. Edelstein, E. Korpela
Published 2001-12-01
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Performance of FIMS Microchannel Plate Detector System by U. W. Nam, J. G. Rhee, K. N. Kong, Y. S. Park, K. C. Jin, H. Jin, J. -H. Park, I. S. Yuk, K. I. Seon, W. Han, D. H. Lee, K. S. Ryu, K. W. Min, J. Edelstein, E. Korpela
Published 2002-12-01
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High Resolution Delay Line Readout Electronics for the FIMS 2-D Position Sensitive Detector by J. G. Rhee, U. W. Nam, K. N. Kong, D. H. Lee, J. H. Shin, I. S. Yuk, H. Jin, K. S. Ryu, K. I. Seon, K. I. Kang, J. H. Park, K. W. Min, W. Y. Han, W. B. Lee, E. korpela, J. Edelstein
Published 2002-03-01
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