VLSI test principles and architectures : design for testability /

VLSI test principles and architectures : design for testability /

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Bibliographic Details
Main Authors: Wang, Laung-Terng, Wu, Cheng-Wen, EE Ph. D., Wen, Xiaoqing
Format:
Language:eng
Published: Amsterdam : Morgan Kaufmann, 2006
Subjects:
Integrated circuits

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