Yield and reliability in microwave circuit and system design /

Yield and reliability in microwave circuit and system design /

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Detalhes bibliográficos
Principais autores: 299143 Meehan, Michael D., Purviance, John
Formato:
Publicado em: Boston : Artech House, 1993
Assuntos:
Microwave integrated circuits
Engineering design
Computer-aided design

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