Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

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Bibliographic Details
Main Authors: Sun, Yichuang, Institution of Engineering and Technology
Format:
Language:eng
Published: London : IET, 2008
Subjects:
Linear integrated circuits
Mixed signal circuits
Radio frequency integrated circuits

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