Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

16

Detalhes bibliográficos
Main Authors: Sun, Yichuang, Institution of Engineering and Technology
Formato:
Idioma:eng
Publicado em: London : IET, 2008
Assuntos:
Linear integrated circuits
Mixed signal circuits
Radio frequency integrated circuits
Descrição
Resumo:16

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