Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach /

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Bibliographic Details
Main Authors:	Sun, Yichuang, Institution of Engineering and Technology
Format:
Language:	eng
Published:	London : IET, 2008
Subjects:	Linear integrated circuits Mixed signal circuits Radio frequency integrated circuits

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