CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware sram design and test /

CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware sram design and test /

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Bibliographic Details
Main Authors: 235875 Pavlov, Andrei, Sachdev, Manoj
Format:
Language:eng
Published: Berlin : Springer, 2008
Subjects:
Metal oxide semiconductors, Complementary
Random access memory
Nanoelectronics

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