Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Language
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Characterization and model dev...
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Permanent link
Characterization and model development of complementary metal oxide semiconductor floating gate defect /
Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2008
Bibliographic Details
Main Authors:
Wong, Yan Chiew, 1981-
,
Abu Khari A'ain, supervisor
,
Fakulti Kejuruteraan Elektrik
Format:
Published:
2008
Subjects:
Metal oxide semiconductors, Complementary
Holdings
Description
Similar Items
Staff View
Similar Items
Characterization and model development of complementary metal oxide semiconductor floating gate defect [electronic resource] /
by: Wong, Yan Chiew, 1981-, et al.
Published: ( 200)
Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage /
by: Muhammad Faisal Ibrahim, 1984-, et al.
Published: (2009)
Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage [electronic resource] /
by: Muhammad Faisal Ibrahim, 1984-, et al.
Published: (2009)
Optimization of nanoscale complementary metal oxide semiconductor performance /
by: 178776 Teoh, Chin Hong
Published: (2007)
Optimization of manoscale complementary metal oxide semiconductor performance [electronic resource] /
by: 178776 Teoh, Chin Hong
Published: (2007)