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Design for testability for com...
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Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage /
Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2009
Bibliographic Details
Main Authors:
Muhammad Faisal Ibrahim, 1984-
,
Abu Khari A'ain, supervisor
,
Fakulti Kejuruteraan Elektrik
Format:
Published:
2009
Subjects:
Metal oxide semiconductors, Complementary
Holdings
Description
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