Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage /
Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2009
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2009
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| _version_ | 1826402549141340160 |
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| author | Muhammad Faisal Ibrahim, 1984- Abu Khari A'ain, supervisor Fakulti Kejuruteraan Elektrik |
| author_facet | Muhammad Faisal Ibrahim, 1984- Abu Khari A'ain, supervisor Fakulti Kejuruteraan Elektrik |
| author_sort | Muhammad Faisal Ibrahim, 1984- |
| collection | OCEAN |
| description | Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2009 |
| first_indexed | 2024-03-05T00:05:03Z |
| format | |
| id | KOHA-OAI-TEST:231854 |
| institution | Universiti Teknologi Malaysia - OCEAN |
| last_indexed | 2024-03-05T00:05:03Z |
| publishDate | 2009 |
| record_format | dspace |
| spelling | KOHA-OAI-TEST:2318542020-12-19T17:07:00ZDesign for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage / Muhammad Faisal Ibrahim, 1984- Abu Khari A'ain, supervisor Fakulti Kejuruteraan Elektrik 2009Thesis (Sarjana Kejuruteraan (Elektrik)) - Universiti Teknologi Malaysia, 2009SPSLMetal oxide semiconductors, Complementary |
| spellingShingle | Metal oxide semiconductors, Complementary Muhammad Faisal Ibrahim, 1984- Abu Khari A'ain, supervisor Fakulti Kejuruteraan Elektrik Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage / |
| title | Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage / |
| title_full | Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage / |
| title_fullStr | Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage / |
| title_full_unstemmed | Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage / |
| title_short | Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage / |
| title_sort | design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage |
| topic | Metal oxide semiconductors, Complementary |
| work_keys_str_mv | AT muhammadfaisalibrahim1984 designfortestabilityforcomplementarymetaloxidesemiconductoranalogcircuittodetectparametricvariationofgateleakage AT abukhariaainsupervisor designfortestabilityforcomplementarymetaloxidesemiconductoranalogcircuittodetectparametricvariationofgateleakage AT fakultikejuruteraanelektrik designfortestabilityforcomplementarymetaloxidesemiconductoranalogcircuittodetectparametricvariationofgateleakage |