Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage /

Eitemau Tebyg

• Design for testability for complementary metal oxide semiconductor analog circuit to detect parametric variation of gate leakage [electronic resource] /
  gan: Muhammad Faisal Ibrahim, 1984-, et al.
  Cyhoeddwyd: (2009)
• Characterization and model development of complementary metal oxide semiconductor floating gate defect /
  gan: Wong, Yan Chiew, 1981-, et al.
  Cyhoeddwyd: (2008)
• Characterization and model development of complementary metal oxide semiconductor floating gate defect [electronic resource] /
  gan: Wong, Yan Chiew, 1981-, et al.
  Cyhoeddwyd: ( 200)
• Compensation technique using CMOS active inductor /
  gan: Muhammad Amir Mohd. Azam, 1991- , author, et al.
  Cyhoeddwyd: (2013)
• Optimization of nanoscale complementary metal oxide semiconductor performance /
  gan: 178776 Teoh, Chin Hong
  Cyhoeddwyd: (2007)