Parameter extraction and geometry effect on the electronical properties of submicron MOS transistors /

Parameter extraction and geometry effect on the electronical properties of submicron MOS transistors /

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Bibliographic Details
Main Authors: Hazri Bakhtiar, Ali Soltani, Hoffmann, Alain, Charles, Jean-Pierre
Format:
Language:eng
Published: Skudai : Universiti Teknologi Malaysia, 2001
Subjects:
Metal oxide semiconductors
Integrated circuits
Transistors

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