Nanophotonics, nanostructure, and nanometrology II : 12-14 November 2007, Beijing, China /

Nanophotonics, nanostructure, and nanometrology II : 12-14 November 2007, Beijing, China /

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Bibliographic Details
Main Authors: Chou, Stephen Y., Arakawa, Yashuhiko, Society of Photo-Optical Instrumentation Engineers
Format:
Language:eng
Published: USA : SPIE, 2008
Subjects:
Nanostructured materials
Photonics
Metrology

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