Design built-in-self-test for ALU using scan cell approach /

Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2002

Bibliografske podrobnosti
Main Authors: 441161 Muhammad Adam Menhat, Abu Khari A'ain, supervisor, Fakulti Kejuruteraan Elektrik
Format:
Jezik:eng
Izdano: 2002
Teme: