Design built-in-self-test for ALU using scan cell approach /

Design built-in-self-test for ALU using scan cell approach /

Project Paper (Sarjana Muda Kejuruteraan (Elektrik - Elektronik)) - Universiti Teknologi Malaysia, 2002

Bibliographic Details
Main Authors: 441161 Muhammad Adam Menhat, Abu Khari A'ain, supervisor, Fakulti Kejuruteraan Elektrik
Format:
Language:eng
Published: 2002
Subjects:
Field programmable gate arrays
Microcontrollers

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